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chore: 关闭部分调试打印并更新充电负载配置

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1.  修改apps/chrg/applications/thread/chrg_north.c，注释掉调试日志打印，同时将DEBUG_NORTH宏默认值改为0关闭该调试开关
2.  修改rt-thread/components/fal/src/fal_rtt.c，注释掉flash读写对比的调试打印
3.  更新apps/chrg/applications/utils/chrg_sink.c的负载控制逻辑，新增短路测试保持时间配置，调整寄存器下发数组长度和初始化参数
This commit is contained in:
wrh
2026-07-21 15:48:16 +08:00
parent 82847e41dd
commit 25b378775d
4 changed files with 18 additions and 11 deletions
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apps/chrg/applications/utils/chrg_sink.c
+15 -8
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@@ -448,9 +448,9 @@ static int chrg_sink_work_init(eIDX_SOU_CH idx, struct chrg_switch_t *pSW)
{
struct chrg_south_t *pSOU = &chrgsouth;
struct chrg_north_t *pNOR = &chrgnorth;
rt_uint16_t regs[4] = {REG_CURRENT_OUT + 1, REG_MODE, 0, 0};
rt_uint16_t vals[4] = {0, pSW->CV_mode, 0, 0};
rt_uint8_t count = 2;
rt_uint16_t regs[5] = {REG_CURRENT_OUT + 1, REG_MODE,Eload_Start_V_ON,0, 0};
rt_uint16_t vals[5] = {0, pSW->CV_mode,pSW->sink.volt_on, 0, 0};
rt_uint8_t count = 3;
if (pSW->sink.test.test_mode_old == 1) {
regs[count] = ModbusRTU_ShortTest_CMD_MODE_FLAG;
@@ -546,10 +546,18 @@ static int chrg_sink_TEST_DYNA_ON(rt_uint8_t ch, struct chrg_switch_t *pSW)
//短路测试启动
static int chrg_sink_TEST_SHORT_ON(rt_uint8_t ch, struct chrg_switch_t *pSW)
{
rt_uint16_t regs[2] = {ModbusRTU_ShortTest_CMD_MODE_FLAG, REG_WORK};
rt_uint16_t vals[2] = {ModbusRTU_DYNA_CMD_MODE_RUN_ALWAYS_KEPP, WORK_START};
return chrg_sou_com_batch_submit((eIDX_SOU_CH)ch, regs, vals, 2);
rt_uint16_t regs[3] = {ModbusRTU_ShortTest_Hold_Time,ModbusRTU_ShortTest_CMD_MODE_FLAG, REG_WORK};
rt_uint16_t vals[3] = {0,0,0};
if(pSW->sink.test.short_test.set_mode == 0)
{
vals[0] = pSW->sink.test.short_test.hold_time;
vals[1] = ModbusRTU_DYNA_CMD_MODE_RUN_NO_CURR;
}
else{
vals[1] = ModbusRTU_DYNA_CMD_MODE_RUN_ALWAYS_KEPP;
}
vals[2] = WORK_START;
return chrg_sou_com_batch_submit((eIDX_SOU_CH)ch, regs, vals, 3);
}
@@ -564,7 +572,6 @@ int chrg_sink_work(eIDX_SOU_CH idx, struct chrg_switch_t *pSW)
return -1;
}
work_mode = pSW->sink.work_mode;
// 本次状态和上次一致，直接跳过，不重复下发寄存器
if (work_mode == last_state[idx]) {
return 0;